Based on the classical substrate curvature method and Stoney formula measurement principle, the FST1000 Thin Film Stress Tester is particularly suitable for rapid measurement of residual stress in hard coatings and other thin films (typical values ranging from 0.1 GPa to 10 GPa magnitude), thanks to its advanced control technology and simplified operation.
Derived from research achievements of the Institute of Metal Research, Chinese Academy of Sciences, and Shenzhen Polytechnic! Patent numbers: CN204854624U; CN203688116U; CN100465615C
| Technical Specifications | Parameters |
| Basic Principl | Laser curvature method based on Stoney's formula |
| ilm Stress Testing Range | 10M-50GPa |
| ROC Testing Range | 0.5-50m |
| Film Stress Calculation Accuracy | ＜ 3% |
| Radius of Curvature Reproducibility | ＜2% |
| Testing Platform Travel | X-axis ：30 mm / Y-axis ：100 mm；Step：0.1 mm |
| Sample Size | Recommended rectangular samples with length-to-width ratio >5:1; Typical size: 10×50×1 mm |
| Sample Correction | Able to calculate and correct raw surface irregularities (for subtractive mode) |
| Main Functions | Ability to build material and measurement parameter databases; Automatic measurement of sample surface contour, curvature, sag height, etc.; Automatic calculation of radius of curvature and film stress; 2D/3D visualization of sample surface contour, radius of curvature, sag height, film stress, etc. |
| Operating Temperature | 0-50℃ |
| Operating Software | Windows interface/Compatible with Windows 10 system |
| Operating Computer | Configuration better than 2GHz CPU, 8GB memory, 256GB hard disk, with no less than 21-inch display screen; Branded all-in-one machine |
| Weight and Dimensions | ～25kg / ～650 mm*350 mm*400 mm |
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